Thursday, November 17, 2022 Session 1: 8 am PST | 11 am EST | 5 pm CET Session 2: 10 am CET | 9 am GMT | 6 pm JST Session 3: 10am JST | 5 pm PST Learn how to automate LNP production with in-line particle size and concentration measurements using multi-angle light scattering (MALS) and dynamic light scattering (DLS).
Verification of lipid nanoparticles (LNP) production via microfluidic precipitation under different formulation conditions usually requires tedious off-line analyses of particle size and polydispersity for each prep. This webinar describes an integrated approach to automating microfluidic production and characterization of LNPs with in-line multi-angle light scattering (MALS) and dynamic light scattering (DLS).
Key Learning Objectives:
Dr. Parot is a passionate researcher with expertise in physico-chemical characterization of nanodrug delivery systems, formulation design, and production of lipid-based nanoparticles. Jérémie specializes in developing and combining analytical methods to accelerate the discovery, characterization, formulation, process development, and quality control of RNA-LNPs and is currently working on microfluidic devices to produce high-quality RNA-LNPs.
He is also responsible for developing standardized methods for characterizing nanomaterials (e.g., within ASTM E56) and regulatory science.
Wyatt Technology Corp
Dr. Daniel Some is Principal Scientist at Wyatt Technology Corp., where he contributes to product and application development as well as scientific and technical marketing. Currently he leads Wyatt’s program for commercializing real-time MALS PAT products. In the past he directed Wyatt’s efforts in instrumentation to characterize biomolecular interactions. Dan studied undergraduate physics at the Technion - Israel Institute of Technology and obtained his Ph.D. in physics from Brown University, then carried out postdoctoral research at Los Alamos National Laboratory and the Weizmann Institute of Science. Prior to joining Wyatt, he was involved in defense technology and the development of processed wafer inspection tools for the semiconductor industry..
Time and Date:
Thursday, November 17, 2022
Session 1: 8 am PST | 11 am EST | 5 pm CET
Session 2: 10 am CET | 9 am GMT | 6 pm JST
Session 3: 10am JST | 5 pm PST